This patent is relevant to advances in particle detection within scientific and industrial applications.
Patent DE102015101639A1 describes a method for evaluating the time-resolved intensity profile of radiation assigned to a measured object, especially droplets, particles, or similar objects in a flow. The invention focuses on reliable signal evaluation in TSTOF devices and helps detect the useful part of measured intensity values while reducing or suppressing noise.
This approach is relevant for optical measurement technology, particle characterization, spray diagnostics, and light scattering analysis. It supports particle detection by improving the evaluation of time-resolved optical signals.
The patent forms part of the technical background behind advanced optical measurement systems for spray measurement, particle detection, and industrial process monitoring. It connects classical signal processing with robust optical diagnostics and provides a foundation for further developments in TSTOF-based measurement technology
